NEIST-SOPHISTICATED ANALYTICAL INSTRUMENT FACILITY (NEIST-SAIF)

Sophisticated Analytical Instruments Facility

Name of the equipment/facility: High-resolution transmission electron microscopy (HRTEM)
Make: JEOL, Japan
Model: JEM-2100 PlusElectron Mocroscope
Specification:
HRTEM (Imaging) (any kind of nanomaterials).
HRTEM-HAADF
HRTEM-Bright
HRTEM-EDS
HRTEM-EDS & Mapping
HRTEM-STM
Working Principle:
Basic principle of TEM is quite similar to their optical counterparts, the optical microscope. The major difference is that in TEM, a focused beam of electrons instead of light is used to "image" and achieve information about the structure and composition of the specimen. An electron source usually named as the “Gun” produces a stream of electrons which is accelerated towards the specimen using a positive electrical potential. This stream is then focused using metal apertures and magnetic lenses called “condenser lenses” into a thin, focused, monochromatic beam. Beam strikes the specimen and a part of it gets transmitted through it. This portion of the beam is again focused using a set of lenses called “objective lenses” into an image. This image is then fed down the column through the “intermediate and projector lenses”, which enlarges the image, depending upon the set magnification. A phosphor image screen is used to produce the image. The image strikes screen and light is engendered, which enables the user to see the image. The darker areas of the image represent the thicker or denser region of the sample (fewer electrons were transmitted) and the lighter areas of the image represent those areas which are thinner or less dense (more electrons were transmitted).
Applications:
Nano science/Nano Technology
Micro/Nano electronicse
Thin Films
Catalysis
Polymer science
Biological and life sciences
Contact
Division: Materials Science and Technology Division.
1. Dr. L. Saikia, Scientist, lsaikia@neist.res.in, 9957031635
2. Dr. Pravin G Ingole, Scientist, pingole@neist.res.in, 7575965040
Charges (Excluding Taxes)

Description of Job

Cliental Type

Charges (in Rs.  ) / per sample (Excluding taxes)

HRTEM-Sample preparation

Industry

400

Educational Institute/Research Institute

100

HRTEM (Imaging)

Industry

10000

Educational Institute/Research Institute

2500

HRTEM-HAADF

Industry

800

Educational Institute/Research Institute

200

HRTEM-Bright Field

Industry

1000

Educational Institute/Research Institute

250

HRTEM-EDS

Industry

800

Educational Institute/Research Institute

200

HRTEM-EDS & Mapping

Industry

1000

Educational Institute/Research Institute

250

HRTEM-STM

Industry

1000

Educational Institute/Research Institute

250

HRTEM-All

CSIR-NEIST

500